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AFM probe tips for scanning probe microscopy - silicon mems - Team Nanotec
Advanced AFM probe tips, characterizers, 3-D silicon based MEMS components: developed manufactured by Team Nanotec , micro- nanofabrication technology.
http://www.team-nanotec.de
Aufgenommen : Fre , 04.Jul 2003 Geändert: Sam , 05.Jul 2003
LinkID: 476646
Linkstatus geprüft : 2011-02-17 00:00:00
- Seitentitel:
afm probe tips for scanning probe microscopy - silicon mems - team nanotec
- afm probe tips for scanning probe microscopy and silicon mems components manufactured by team nanotec, covers silicon etching, microfabrication, microoptics, nanotechnology, nanofabrication
- afm probe tips, dimension x3d, scanning probe microscopy, silicon mems components, team nanotec, silicon etching, spm, mfm, veeco, cantilever
- science, semiconductor industry, scanning probe microscopy, mems, nanotechnology, microoptics, silicon components
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